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JOINT
IAPR INTERNATIONAL WORKSHOPS ON
Structural and Syntactic Pattern Recognition
(SSPR 2006)
and
Statistical
Techniques in Pattern Recognition
(SPR 2006)
Hong Kong, China, August 17-19, 2006

The International Association for Pattern Recognition (IAPR) and its
committees on Statistical PR
(TC1) and Syntactical
and Structural PR (TC2) will organize the next joint
workshops at the Hong Kong University of Science and Technology (HKUST)
prior to the 18th International Conference on Pattern Recognition, ICPR 2006, which will also be held in Hong Kong.
The joint workshops
aim at promoting interaction and collaboration not only among researchers
working directly in areas covered by TC1 and TC2 but also among those in
other fields who use statistical, structural or syntactic techniques
extensively. We welcome mathematicians, statisticians, researchers in
machine learning and practitioners alike who, at present, work outside the
pattern recognition community.
Dept. of Computer Science
Hong Kong University of Science and Technology
Clear Water Bay, Kowloon
Hong Kong, China
Dept. of Computer Science
Hong Kong University of Science and Technology
Clear Water Bay, Kowloon
Hong Kong, China
Robert P.W. Duin (Netherlands)
Erkki Oja (Finland)
Tieniu Tan (China)
Anil K. Jain (USA)
Harry Shum (China)
Telephone +852-2358-6977 Fax +852-2358-1477 Postal Address S+SSPR 2006
Dr. Dit-Yan Yeung
Dept. of Computer Science
Hong Kong University of Science and Technology
Clear Water Bay, Kowloon
Hong Kong, China
e-mail General Information:
Webmaster: Dick de Ridder,
Information & Communication Theory Group
Faculty of Electrical Engineering, Mathematics and Computer Science
Delft University of Technology
Delft, The Netherlands